We propose a statistical processing method to reduce the time of chip test of high-resolution and low-speed analog-to-digital converters (ADCs). For this kinds of ADCs, due to the influence of noise, conventional histogram or momentum method suffers from long time to collect required data for averaging. The proposed method, based on physically weighing the ADC, intending to physical weights in ADC/DAC under test. It can suppress white noise to 1/22 than conventional method in a case of 10bit binary ADC. Or it can reduce test data to 1/8 or less, which directly means to reduce measuring time to 1/8 or less. In addition, it earns complete Integrated Non-Linearity (INL) and Differential Non-linearity (DNL) even missing codes happens due to less data points. In this report, we theoretically describe how to guarantee missing codes at lacked measured data points.

A continuous-time (CT) ΔΣ analog-to-digital converter (ADC) is a high resolution, wide-bandwidth ADC. A Gm-C filter is suitable for low power consumption and its frequency characteristics for a loop filter of the ADC. However, in practice, distortion generated in the Gm-C filter degrades the SNDR of the ADC, therefore a high-linearity Gm-cell with low power consumption is needed. A flipped voltage follower (FVF) Gm-cell is also used as a high-linearity Gm-cell, but distortion is caused by variation of drain-source voltage of its input transistors. In this paper, a new high-linearity Gm-cell is proposed for the CT ΔΣ ADC in order to address this problem. A proposed topology is a combination of a FVF and a cascode topology. The inserted transistors in the proposed Gm-cell behave as cascode transistors, therefore the drain-source voltage variation of the input transistor and a PMOS transistor for current source which causes distortion is suppressed. Simulation results show the proposed Gm-cell can realize the same linearity as the conventional Gm-cell with reducing 36% power consumption. A 20MHz-bandwidth CT ΔΣ ADC employing the proposed Gm-cells achieves SNDR of 72.4dB with power consumption of 6.8mW. Active area and FoM of the ADC are, respectively, 250μm × 220μm and 50fJ/conv.-step in 65nm CMOS process.

A fully synthesizable all-digital phase-locked loop (AD-PLL) with a stochastic time-to-digital converter (STDC) is proposed in this paper. The whole AD-PLL circuit design is based on only standard cells from digital library, thus the layout of this AD-PLL can be automatically synthesized by a commercial place-and-route (P&R) tool with a foundry-provided standard-cell library. No manual layout and process modification is required in the whole AD-PLL design. In order to solve the delay mismatch issue in the delay-line-based time-to-digital converter (TDC), an STDC employing only standard D flip-flop (DFF) is presented to mitigate the sensitivity to layout mismatch resulted from automatic P&R. For the stochastic TDC, the key idea is to utilize the layout uncertainty due to automatic P&R which follows Gaussian distribution according to statistics theory. Moreover, the fully synthesized STDC can achieve a finer resolution compared to the conventional TDC. Implemented in a 28nm fully depleted silicon on insulator (FDSOI) technology, the fully synthesized PLL consumes only 480µW under 1.0V power supply while operating at 0.9GHz. It achieves a figure of merit (FoM) of -231.1dB with 4.0ps RMS jitter while occupying 0.0055mm2 chip area only.